| Home | March 2015News | Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes |
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 Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes- Is your AFM Tip Tall Enough? - CDI Introduces New AFM Probes
- March 23, 2015
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Carbon Design Innovations, Inc.'s introduces new probe technology for high aspect ratio imaging with their new TN series.
Every atomic force microscope (AFM) needs high aspect ratio (HAR) capability at least some of the time. The new TN series of HAR probes from Carbon Design Innovations, Inc. (CDI) are for samples 25nm or taller. TN probe technology is unlike any previous AFM probe in the market. All scanning probe microscope (SPM) and AFM probes of the TN series are made from a proprietary Carbon based composite material with the stability of Silicon but the toughness of Carbon. They are chemically inert and offe...
- View more at: http://www.1888pressrelease.com/afm/high-aspect-ratio/is-your-afm-tip-tall-enough-cdi-introduces-new-afm-probes-pr-558659.html
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